Low Power Test Compression Technique for Designs with Multiple Scan Chain - researchr publication authors

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Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki, Shinji Kimura. Low Power Test Compression Technique for Designs with Multiple Scan Chain. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 386-389, IEEE Computer Society, 2005. [doi]

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