Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki, Shinji Kimura. Low Power Test Compression Technique for Designs with Multiple Scan Chain. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 386-389, IEEE Computer Society, 2005. [doi]
@inproceedings{ShiTYOK05, title = {Low Power Test Compression Technique for Designs with Multiple Scan Chain}, author = {Youhua Shi and Nozomu Togawa and Masao Yanagisawa and Tatsuo Ohtsuki and Shinji Kimura}, year = {2005}, doi = {10.1109/ATS.2005.76}, url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.76}, tags = {testing}, researchr = {https://researchr.org/publication/ShiTYOK05}, cites = {0}, citedby = {0}, pages = {386-389}, booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India}, publisher = {IEEE Computer Society}, isbn = {0-7695-2481-8}, }