ILLIADS: a fast timing and reliability simulator for digital MOS circuits

Yung-Ho Shih, Yusuf Leblebici, Sung-Mo Kang. ILLIADS: a fast timing and reliability simulator for digital MOS circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 12(9):1387-1402, 1993. [doi]

Abstract

Abstract is missing.