Yu-An Shih, Sharad Malik. Automatic Verification and Identification of Partial Retention Register Sets for Low-Power Designs. In Jinjun Xiong, Robert Wille, editors, Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2024, Newark Liberty International Airport Marriott, NJ, USA, October 27-31, 2024. ACM, 2024. [doi]
Abstract is missing.