Hyunyoung Shim, Myoungkwan Cho, Kunok Ahn, Gihyun Bae, Sungwook Park. Novel integration technologies for improving reliability in NAND flash memory. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 424-427, IEEE, 2012. [doi]
Abstract is missing.