Lithographic defect aware placement using compact standard Cells without inter-cell margin

Seongbo Shim, Yoojong Lee, Youngsoo Shin. Lithographic defect aware placement using compact standard Cells without inter-cell margin. In 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014. pages 47-52, IEEE, 2014. [doi]

Abstract

Abstract is missing.