Masashi Shimanouchi. New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 903-912, IEEE Computer Society, 2002. [doi]
@inproceedings{Shimanouchi02, title = {New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing}, author = {Masashi Shimanouchi}, year = {2002}, url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430903abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/Shimanouchi02}, cites = {0}, citedby = {0}, pages = {903-912}, booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, publisher = {IEEE Computer Society}, }