Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita. Built-in Self-Test for State Faults Induced by Crosstalk in Sequential Circuits. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 469, IEEE Computer Society, 2001. [doi]
Abstract is missing.