Reisuke Shimoda, Takaki Yoshida, Masafumi Watari, Yasuhiro Toyota, Kiyokazu Nishi, Akira Motohara. Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits. In 8th Asian Test Symposium (ATS 99), 16-18 November 1999, Shanghai, China. pages 347, IEEE Computer Society, 1999. [doi]
Abstract is missing.