T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, S. Funatsu. An AC/DC Test Generation System for Gate Array LSIs. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 329-333, IEEE Computer Society, 1985.
@inproceedings{ShimonoOTKF85,
title = {An AC/DC Test Generation System for Gate Array LSIs},
author = {T. Shimono and K. Oozeki and M. Takahashi and Masato Kawai and S. Funatsu},
year = {1985},
tags = {testing},
researchr = {https://researchr.org/publication/ShimonoOTKF85},
cites = {0},
citedby = {0},
pages = {329-333},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985},
publisher = {IEEE Computer Society},
}