An AC/DC Test Generation System for Gate Array LSIs

T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, S. Funatsu. An AC/DC Test Generation System for Gate Array LSIs. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 329-333, IEEE Computer Society, 1985.

Abstract

Abstract is missing.