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Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects

Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim. Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. IEEE Trans. VLSI Syst., 12(4):395-407, 2004.

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