Loop Closure Detection in Simultaneous Localization and Mapping Using Learning Based Local Patch Descriptor

Dong-won Shin, Yo-Sung Ho. Loop Closure Detection in Simultaneous Localization and Mapping Using Learning Based Local Patch Descriptor. In Patrick Denny, Darnell Moore, Buyue Zhang, editors, Autonomous Vehicles and Machines 2018, Burlingame, CA, USA, January 28 - February 1, 2018. pages 1-6, Society for Imaging Science and Technology, 2018. [doi]

@inproceedings{ShinH18-5,
  title = {Loop Closure Detection in Simultaneous Localization and Mapping Using Learning Based Local Patch Descriptor},
  author = {Dong-won Shin and Yo-Sung Ho},
  year = {2018},
  doi = {10.2352/ISSN.2470-1173.2018.17.AVM-284},
  url = {https://doi.org/10.2352/ISSN.2470-1173.2018.17.AVM-284},
  researchr = {https://researchr.org/publication/ShinH18-5},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {Autonomous Vehicles and Machines 2018, Burlingame, CA, USA, January 28 -  February 1, 2018},
  editor = {Patrick Denny and Darnell Moore and Buyue Zhang},
  publisher = {Society for Imaging Science and Technology},
}