Tae-ho Shin, Jaeduk Han. A SCAN Chain Generator for Verification of Full-Custom Integrated Circuits. In 18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021. pages 335-336, IEEE, 2021. [doi]
@inproceedings{ShinH21-1,
title = {A SCAN Chain Generator for Verification of Full-Custom Integrated Circuits},
author = {Tae-ho Shin and Jaeduk Han},
year = {2021},
doi = {10.1109/ISOCC53507.2021.9613981},
url = {https://doi.org/10.1109/ISOCC53507.2021.9613981},
researchr = {https://researchr.org/publication/ShinH21-1},
cites = {0},
citedby = {0},
pages = {335-336},
booktitle = {18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021},
publisher = {IEEE},
isbn = {978-1-6654-0174-6},
}