A SCAN Chain Generator for Verification of Full-Custom Integrated Circuits

Tae-ho Shin, Jaeduk Han. A SCAN Chain Generator for Verification of Full-Custom Integrated Circuits. In 18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021. pages 335-336, IEEE, 2021. [doi]

Abstract

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