Hongjoong Shin, Byoungho Kim, Jacob A. Abraham. Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 412-419, IEEE Computer Society, 2006. [doi]
@inproceedings{ShinKA06,
title = {Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits},
author = {Hongjoong Shin and Byoungho Kim and Jacob A. Abraham},
year = {2006},
doi = {10.1109/VTS.2006.83},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.83},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/ShinKA06},
cites = {0},
citedby = {0},
pages = {412-419},
booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2514-8},
}