The following publications are possibly variants of this publication:
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- Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit SpecificationsByoungho Kim, Jacob A. Abraham. tie, 66(1):586-594, 2019. [doi]
- Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System SpecificationsByoungho Kim. tcas, 63-II(2):121-125, 2016. [doi]
- Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal CircuitsByoungho Kim, Nash Khouzam, Jacob A. Abraham. vts 2008: 293-298 [doi]
- Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal CircuitsByoungho Kim, Jacob A. Abraham. tcas, 58-I(8):1773-1784, 2011. [doi]
- Parallel Loopback Test of Mixed-Signal CircuitsJoonsung Park, Hongjoong Shin, Jacob A. Abraham. vts 2008: 309-316 [doi]
- Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic SpecificationsByoungho Kim, Jacob A. Abraham. tim, 60(6):2014-2024, 2011. [doi]
- Transformer-Coupled Loopback Test for Differential Mixed-Signal SpecificationsByoungho Kim, Zhenhai Fu, Jacob A. Abraham. vts 2007: 291-296 [doi]