Zuitoku Shin, Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, Takashi Sato. A study on NBTI-induced delay degradation considering stress frequency dependence. In 19th International Symposium on Quality Electronic Design, ISQED 2018, Santa Clara, CA, USA, March 13-14, 2018. pages 251-256, IEEE, 2018. [doi]
Abstract is missing.