At-speed logic BIST using a frozen clock testing strategy - researchr publication

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Jongshin Shin, Xiaoming Yu, Elizabeth M. Rudnick, Miron Abramovici. At-speed logic BIST using a frozen clock testing strategy. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 64-71, IEEE Computer Society, 2001.

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