Mitsuru Shinagawa, Tadao Nagatsuma. An Automated Optical On-Wager Probing System for Ultra-High-Speed ICs. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 834-839, IEEE Computer Society, 1992.
@inproceedings{ShinagawaN92,
title = {An Automated Optical On-Wager Probing System for Ultra-High-Speed ICs},
author = {Mitsuru Shinagawa and Tadao Nagatsuma},
year = {1992},
researchr = {https://researchr.org/publication/ShinagawaN92},
cites = {0},
citedby = {0},
pages = {834-839},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}