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An Automated Optical On-Wager Probing System for Ultra-High-Speed ICs

Mitsuru Shinagawa, Tadao Nagatsuma. An Automated Optical On-Wager Probing System for Ultra-High-Speed ICs. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 834-839, IEEE Computer Society, 1992.

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