Michihiro Shintani, Michiko Inoue, Yoshiyuki Nakamura. Artificial Neural Network Based Test Escape Screening Using Generative Model. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-8, IEEE, 2018. [doi]
@inproceedings{ShintaniIN18,
title = {Artificial Neural Network Based Test Escape Screening Using Generative Model},
author = {Michihiro Shintani and Michiko Inoue and Yoshiyuki Nakamura},
year = {2018},
doi = {10.1109/TEST.2018.8624821},
url = {https://doi.org/10.1109/TEST.2018.8624821},
researchr = {https://researchr.org/publication/ShintaniIN18},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018},
publisher = {IEEE},
isbn = {978-1-5386-8382-8},
}