Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu. An Adaptive Test for Parametric Faults Based on Statistical Timing Information. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 151-156, IEEE Computer Society, 2009. [doi]
Abstract is missing.