Jun Shiomi, Shogo Terada, Tohru Ishihara, Hidetoshi Onodera. Zero-Aware Fine-Grained Power Gating for Standard-Cell Memories in Voltage-Scaled Circuits. In Sakir Sezer, Thomas Büchner, Jürgen Becker 0001, Andrew Marshall, Fahad Siddiqui 0001, Tanja Harbaum, Kieran McLaughlin, editors, 35th IEEE International System-on-Chip Conference, SOCC 2022, Belfast, United Kingdom, September 5-8, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.