Mohammad Abdullah Al Shohel, Vidya A. Chhabria, Nestor E. Evmorfopoulos, Sachin S. Sapatnekar. Analytical Modeling of Transient Electromigration Stress based on Boundary Reflections. In IEEE/ACM International Conference On Computer Aided Design, ICCAD 2021, Munich, Germany, November 1-4, 2021. pages 1-8, IEEE, 2021. [doi]
Abstract is missing.