Wafer-YOLO: A lightweight object detection network for wafer inspection

Xiaotong Shu, Zhenzhi He, Jiayi Yuan, Guo Ye, Tianchi Chen, Lianchao Sheng, Xiangning Lu. Wafer-YOLO: A lightweight object detection network for wafer inspection. Microelectronics Journal, 176:107352, 2026. [doi]

Abstract

Abstract is missing.