Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawat, W. Robert Daasch, John M. Carulli. Consistency in wafer based outlier screening. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-6, IEEE Computer Society, 2016. [doi]
Abstract is missing.