Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Mathieu Sicre, Megan Agnew, Christel Buj, Jean Coignus, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy 0001, Francis Calmon. Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study. In 47th ESSCIRC 2021 - European Solid State Circuits Conference, ESSCIR 2021, Grenoble, France, September 13-22, 2021. pages 143-146, IEEE, 2021. [doi]

This author has not been identified. Look up 'Mathieu Sicre' in GoogleThis author has not been identified. Look up 'Megan Agnew' in GoogleThis author has not been identified. Look up 'Christel Buj' in GoogleThis author has not been identified. Look up 'Jean Coignus' in GoogleThis author has not been identified. Look up 'Dominique Golanski' in GoogleThis author has not been identified. Look up 'Rémi Helleboid' in GoogleThis author has not been identified. Look up 'Bastien Mamdy' in GoogleThis author has not been identified. Look up 'Isobel Nicholson' in GoogleThis author has not been identified. Look up 'Sara Pellegrini' in GoogleThis author has not been identified. Look up 'Denis Rideau' in GoogleThis author has not been identified. Look up 'David Roy 0001' in GoogleThis author has not been identified. Look up 'Francis Calmon' in Google

runs on WebDSL