Mathieu Sicre, Megan Agnew, Christel Buj, Jean Coignus, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy 0001, Francis Calmon. Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study. In 51st IEEE European Solid-State Device Research Conference, ESSDERC 2021, Grenoble, France, September 13-22, 2021. pages 143-146, IEEE, 2021. [doi]
Abstract is missing.