Arif Siddiqi, Navneet Jain, Mahbub Rashed. Back-bias generator for post-fabrication threshold voltage tuning applications in 22nm FD-SOI process. In 19th International Symposium on Quality Electronic Design, ISQED 2018, Santa Clara, CA, USA, March 13-14, 2018. pages 268-273, IEEE, 2018. [doi]
Abstract is missing.