Taniya Siddiqua, Vilas Sridharan, Steven E. Raasch, Nathan DeBardeleben, Kurt B. Ferreira, Scott Levy, Elisabeth Baseman, Qiang Guan. Lifetime memory reliability data from the field. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.