Thais Luana Vidal de Negreiros da Silva, Guo-Neng Lu, Patrick Pittet. Breakdown Voltage Shift of CMOS Buried Quad Junction (BQJ) Detector. In Conference on Design of Circuits and Integrated Systems, DCIS 2018, Lyon, France, November 14-16, 2018. pages 1-6, IEEE, 2018. [doi]
Abstract is missing.