Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review

Kok-Swee Sim, Iksan Bukhori, Dominic Chee Yong Ong, Gan Kok Beng. Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review. IEEE Access, 13:154395-154421, 2025. [doi]

Authors

Kok-Swee Sim

This author has not been identified. Look up 'Kok-Swee Sim' in Google

Iksan Bukhori

This author has not been identified. Look up 'Iksan Bukhori' in Google

Dominic Chee Yong Ong

This author has not been identified. Look up 'Dominic Chee Yong Ong' in Google

Gan Kok Beng

This author has not been identified. Look up 'Gan Kok Beng' in Google