Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review

Kok-Swee Sim, Iksan Bukhori, Dominic Chee Yong Ong, Gan Kok Beng. Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review. IEEE Access, 13:154395-154421, 2025. [doi]

@article{SimBOB25,
  title = {Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review},
  author = {Kok-Swee Sim and Iksan Bukhori and Dominic Chee Yong Ong and Gan Kok Beng},
  year = {2025},
  doi = {10.1109/ACCESS.2025.3603013},
  url = {https://doi.org/10.1109/ACCESS.2025.3603013},
  researchr = {https://researchr.org/publication/SimBOB25},
  cites = {0},
  citedby = {0},
  journal = {IEEE Access},
  volume = {13},
  pages = {154395-154421},
}