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Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review

Kok-Swee Sim, Iksan Bukhori, Dominic Chee Yong Ong, Gan Kok Beng. Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review. IEEE Access, 13:154395-154421, 2025. [doi]

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