Impact of layout and channel processing on CMOS low frequency noise variability

Fausto Simioni, Lorenzo Labate, Daniele Savio, Mariella Brizzi, Federica Ottogalli, Riccardo Marchetti, Silvia Brazzelli, Mattia Rossetti. Impact of layout and channel processing on CMOS low frequency noise variability. In 53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023. pages 17-20, IEEE, 2023. [doi]

Abstract

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