Automatic test case generation for PLC programs using coverage metrics

Hendrik Simon, Nico Friedrich, Sebastian Biallas, Stefan Hauck-Stattelmann, Bastian Schlich, Stefan Kowalewski. Automatic test case generation for PLC programs using coverage metrics. In 20th IEEE Conference on Emerging Technologies & Factory Automation, ETFA 2015, Luxembourg, September 8-11, 2015. pages 1-4, IEEE, 2015. [doi]

@inproceedings{SimonFBHSK15,
  title = {Automatic test case generation for PLC programs using coverage metrics},
  author = {Hendrik Simon and Nico Friedrich and Sebastian Biallas and Stefan Hauck-Stattelmann and Bastian Schlich and Stefan Kowalewski},
  year = {2015},
  doi = {10.1109/ETFA.2015.7301602},
  url = {http://dx.doi.org/10.1109/ETFA.2015.7301602},
  researchr = {https://researchr.org/publication/SimonFBHSK15},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {20th IEEE Conference on Emerging Technologies & Factory Automation, ETFA 2015, Luxembourg, September 8-11, 2015},
  publisher = {IEEE},
  isbn = {978-1-4673-7929-8},
}