An Intelligent Approach to Automatic Test Equipment - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

William R. Simpson, John W. Sheppard. An Intelligent Approach to Automatic Test Equipment. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 419-425, IEEE Computer Society, 1991.

This author has not been identified. Look up 'William R. Simpson' in GoogleThis author has not been identified. Look up 'John W. Sheppard' in Google

runs on WebDSL