William R. Simpson, John W. Sheppard. An Intelligent Approach to Automatic Test Equipment. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 419-425, IEEE Computer Society, 1991.
@inproceedings{SimpsonS91,
title = {An Intelligent Approach to Automatic Test Equipment},
author = {William R. Simpson and John W. Sheppard},
year = {1991},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/SimpsonS91},
cites = {0},
citedby = {0},
pages = {419-425},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}