Ozgur Sinanoglu, Alex Orailoglu. A novel scan architecture for power-efficient, rapid test. In Lawrence T. Pileggi, Andreas Kuehlmann, editors, Proceedings of the 2002 IEEE/ACM International Conference on Computer-aided Design, 2002, San Jose, California, USA, November 10-14, 2002. pages 299-303, ACM, 2002. [doi]
@inproceedings{SinanogluO02, title = {A novel scan architecture for power-efficient, rapid test}, author = {Ozgur Sinanoglu and Alex Orailoglu}, year = {2002}, doi = {10.1145/774572.774617}, url = {http://doi.acm.org/10.1145/774572.774617}, tags = {architecture, testing}, researchr = {https://researchr.org/publication/SinanogluO02}, cites = {0}, citedby = {0}, pages = {299-303}, booktitle = {Proceedings of the 2002 IEEE/ACM International Conference on Computer-aided Design, 2002, San Jose, California, USA, November 10-14, 2002}, editor = {Lawrence T. Pileggi and Andreas Kuehlmann}, publisher = {ACM}, isbn = {0-7803-7607-2}, }