Suraj Sindia, Vishwani D. Agrawal, Virendra Singh. Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 64-69, IEEE Computer Society, 2011. [doi]
Abstract is missing.