Scan based two-pattern tests: should they target opens instead of TDFs?

Adit D. Singh. Scan based two-pattern tests: should they target opens instead of TDFs?. In 16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta, Mexico, March 25-27, 2015. pages 1-2, IEEE, 2015. [doi]

Abstract

Abstract is missing.