An Adaptive Approach to Minimize System Level Tests Targeting Low Voltage DVFS Failures

Adit D. Singh. An Adaptive Approach to Minimize System Level Tests Targeting Low Voltage DVFS Failures. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-10, IEEE, 2019. [doi]

Abstract

Abstract is missing.