Software based in-system memory test for highly available systems - researchr publication authors

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Amandeep Singh, Debashish Bose, Sandeep Darisala. Software based in-system memory test for highly available systems. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 89-94, IEEE Computer Society, 2005. [doi]

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