Amandeep Singh, Debashish Bose, Sandeep Darisala. Software based in-system memory test for highly available systems. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 89-94, IEEE Computer Society, 2005. [doi]
@inproceedings{SinghBD05-0,
title = {Software based in-system memory test for highly available systems},
author = {Amandeep Singh and Debashish Bose and Sandeep Darisala},
year = {2005},
doi = {10.1109/MTDT.2005.34},
url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2005.34},
researchr = {https://researchr.org/publication/SinghBD05-0},
cites = {0},
citedby = {0},
pages = {89-94},
booktitle = {13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2313-7},
}