Silent Data Errors: Sources, Detection, and Modeling

Adit D. Singh, Sreejit Chakravarty, George Papadimitriou 0001, Dimitris Gizopoulos. Silent Data Errors: Sources, Detection, and Modeling. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-12, IEEE, 2023. [doi]

Abstract

Abstract is missing.