Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradaric, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui. Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 400-409, IEEE, 2022. [doi]
Abstract is missing.