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Scan Chain Adaptation through ECO

Jasvir Singh, Anuj Grover, Mausumi Pohit, Anurag Singh Baghel, Gurjit Kaur, Shalini Pathak. Scan Chain Adaptation through ECO. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 107-112, IEEE Computer Society, 2016. [doi]

Authors

Jasvir Singh

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Anuj Grover

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Mausumi Pohit

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Anurag Singh Baghel

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Gurjit Kaur

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Shalini Pathak

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