Jasvir Singh, Anuj Grover, Mausumi Pohit, Anurag Singh Baghel, Gurjit Kaur, Shalini Pathak. Scan Chain Adaptation through ECO. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 107-112, IEEE Computer Society, 2016. [doi]
Abstract is missing.