Jasvir Singh, Anuj Grover, Mausumi Pohit, Anurag Singh Baghel, Gurjit Kaur, Shalini Pathak. Scan Chain Adaptation through ECO. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 107-112, IEEE Computer Society, 2016. [doi]
@inproceedings{SinghGPBKP16,
title = {Scan Chain Adaptation through ECO},
author = {Jasvir Singh and Anuj Grover and Mausumi Pohit and Anurag Singh Baghel and Gurjit Kaur and Shalini Pathak},
year = {2016},
doi = {10.1109/ATS.2016.16},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.16},
researchr = {https://researchr.org/publication/SinghGPBKP16},
cites = {0},
citedby = {0},
pages = {107-112},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}